CMOS Test and Evaluation: A Physical Perspective By Manjul Bhushan
2015 | 440 Pages | ISBN: 1493913484 | PDF | 20 MB
is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
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